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AFM of FIB Deposited Pt

Media Details
Created 10/22/2002 5:00:00 AM
Focused Ion Beam assisted Pt deposition on Si by varying the dwell time of the beam on individual pixels on a pattern created in Adobe Illustrator
Credits
- Soma Chattopadhyay , Beckman Institute
- Paul Bohn , Beckman Institute
Imaging Technology Group
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